首页> 外文会议>Fifteenth International Symposium on Chemical Vapor Deposition, May 14-18, 2000, Toronto, Ontario >EVALUATION OF GAS PHASE REACTION RATE CONSTANT BY DEPOSITION PROFILE ANALYSIS FOR IN-SITU COUNTER DIFFUSION CVD
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EVALUATION OF GAS PHASE REACTION RATE CONSTANT BY DEPOSITION PROFILE ANALYSIS FOR IN-SITU COUNTER DIFFUSION CVD

机译:原位对流扩散CVD沉积物谱分析估算气相反应速率常数

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摘要

A modification of counter diffusion CVD, named in-situ counter diffusion CVD, using catalyst for producing reactant gas inside the reactor, is applied for estimating gas phase reaction between A1C13 and H2O in A12O3 CVD from A1C13/CO2/H2 reaction system. In counter diffusion CVD, two reactant gas diffuse from counter sides of the porous media to react and deposit narrow band of solid, and the width of deposition band depends on the rate of deposition process. Deposition experiment at 573 K on porous sintered stainless steel substrate with average pore size of 20μm - 100μm shows that the band width is independent to pore diameter. This indicates that the controlling step of the deposition process is the gas phase reaction and the width reflects some information on gas phase reaction rate. By simulation work assuming the 2nd order reaction the rate constant is estimated as 700 m~3 *mol~(-1) at 573 K.
机译:反扩散CVD的一种改进形式,即原位反扩散CVD,它使用催化剂在反应器内部产生反应气体,被用于估算AlCl3 / CO2 / H2反应体系中AlCl3和CVD中AlCl3和H2O之间的气相反应。在逆扩散CVD中,两种反应气体从多孔介质的相对侧扩散以反应并沉积窄的固体带,并且沉积带的宽度取决于沉积过程的速率。在平均孔径为20μm-100μm的多孔烧结不锈钢基底上于573 K上进行的沉积实验表明,带宽与孔径无关。这表明沉积过程的控制步骤是气相反应,其宽度反映了一些有关气相反应速率的信息。通过模拟工作假设二阶反应,速率常数在573 K时估计为700 m〜3 * mol〜(-1)。

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