High-Sensitivity Magnetic Probe Design on EMI Measurement for Micro-Controller

摘要

The trend of smart vehicle for ever increasing need on safe and comfortable driving environment, the more electronic equipment and electronic control unit (ECU) are implemented on automotive. Since the multi-purpose micro-controllers are widely adopted by automotive industry for advanced functional features, their EMI characteristics is crucial for safety issue because of possibly degraded communication signal due to EMI noise. There are also increasing RFI problem resulting from high-speed digital devices interfering wireless communication module on board. We therefore will investigate the EMI and RFI phenomena of micro-controller under different clock frequencies and operating voltages in this study. We will utilize the chip level EMI measurement methods IEC 61967-2[1] and IEC 61967-3[2] with self-designed high-sensitivity near-field probe. With the measured results and related EMI data analyzed, we can establish the EMI list of micro-controller and provide design reference for automotive electronics meeting EMI compliance requirement.