Design and Application of Radio Frequency Current Probe for IC-EMI Measurement

摘要

This paper is to study and design a 1 ohm resistive current probe for radio frequency grounded current of an IC. Analyzing several impact factors such as impedance, package size, numbers, and placement ways of the discrete resistors as well as the length of microstrip lines on the PCB, the specification of the 1 ohm probe fully compliant with the IEC 61967-4 international standard is achieved. Finally, the conducted EME experiment of the MCU test board is demonstrated for the use of this probe.