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New Type of Silicon Photoelectronic Negative Resistance Devices-- PDUBAT

机译:新型硅光电负阻器件-PDUBAT

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Photoelectronic DUal Base Transistor (PDUBAT) is a novel kind of photoelectronic negative resistance devices, which features 'N' type negative resistance and small negative resistance |R_N|. PDUBAT consists of a vertical NPN bipolar transistor and a P type diffusion region with large area over a specific distance. The base and collector of the vertical NPN BIT with a large P diffusion region form a lateral PNP BJT. The emitter and collector of the vertical NPN BJT are connected to the ground and voltage supply respectively, while the P diffusion region is left floated to detect input light signal. When the device is exposed to light, a large number of electron-hole pairs are generated at the PN junction under the P diffusion region. The holes travel along the base of the lateral PNP BJT and become the driving current of the vertical NPN BJT. In experiments, we found that PDUBAT acts as a pulse oscillator without the load of inductors, whose frequency and magnitude are modulated by the intensity of incident light. The oscillating frequency increases while the magnitude decreases with the increasing of light intensity. The manufacturing process of PDUBAT is compatible with that of BJTs, so that it can be incorporated with the ICs.
机译:光电双基极晶体管(PDUBAT)是一种新型的光电负电阻器件,具有“ N”型负电阻和小的负电阻| R_N |。 PDUBAT由一个垂直NPN双极晶体管和一个P型扩散区域组成,该区域在特定距离上具有较大的面积。具有较大P扩散区域的垂直NPN BIT的基极和集电极形成横向PNP BJT。垂直NPN BJT的发射极和集电极分别连接到地和电源,而P扩散区则悬空以检测输入光信号。当器件暴露在光下时,在P扩散区下方的PN结处会产生大量的电子-空穴对。空穴沿着横向PNP BJT的底部传播,并成为垂直NPN BJT的驱动电流。在实验中,我们发现PDUBAT充当脉冲振荡器,而没有电感器的负载,电感器的频率和幅度由入射光的强度调制。随着光强度的增加,振荡频率增加而幅度减小。 PDUBAT的制造过程与BJT的制造过程兼容,因此可以与IC集成在一起。

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