首页> 外文会议>Conference on Semiconductor Lasers and Applications; 20071112-14; Beijing(CN) >Investigation of semi-insulating GaAs photoconductive switches triggered by semiconductor lasers
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Investigation of semi-insulating GaAs photoconductive switches triggered by semiconductor lasers

机译:半导体激光器触发的半绝缘GaAs光电导开关的研究

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The experiment result of semi-insulating GaAs photoconductive semiconductor switch ( PCSS ) with different electrode gaps triggered by semiconductor laser is reported. With the biased voltage of 500V, the semi-insulating GaAs PCSS with 2mm electrode gap is triggered by laser pulse with 5ns pulse width and repetition rate of 15 kHz, then two groups of electrical pulse samples indicate that laser pulse is instable when laser energy is very low. With the biased voltage of 210V, the GaAs PCSS with 0.5mm electrode gap is triggered by the laser pulse in several dozens nanoseconds at 905nm with a repetition rate of 2 kHz. A stable linear electrical pulse is observed. When the energy of the laser increases, the amplitude and the width of the electrical pulse also increase. It indicates that a stable electrical pulse is obtained while laser energy is high. With the biased voltage of 2400V, the GaAs PCSS with 1mm electrode gap is triggered by laser pulse about 100nJ in 40ns at 904nm. The GaAs PCSS switches a electrical pulse with a voltage up to 1700V. Carriers accumulation effect is discussed and the critical value of carriers accumulation effect is given. The relation of the biased voltage, electrode gap and carriers accumulation effect is also discussed. The concentration of deep EL_2 traps in GaAs has a certain effect on nonlinear mode of GaAs PCSS.
机译:报道了半导体激光器触发不同电极间隙的半绝缘GaAs光电导开关的实验结果。在500V的偏置电压下,电极间隙为2mm的半绝缘GaAs PCSS由5ns脉冲宽度和15 kHz重复频率的激光脉冲触发,然后两组电脉冲样本表明当激光能量为时,激光脉冲不稳定。非常低。在210V的偏置电压下,电极间隙为0.5mm的GaAs PCSS被905nm处几十纳秒的激光脉冲触发,重复频率为2 kHz。观察到稳定的线性电脉冲。当激光的能量增加时,电脉冲的幅度和宽度也会增加。这表明当激光能量很高时,可获得稳定的电脉冲。在2400V的偏置电压下,电极间隙为1mm的GaAs PCSS在904nm的40ns内被约100nJ的激光脉冲触发。 GaAs PCSS切换电压高达1700V的电脉冲。讨论了载流子积累效应,并给出了载流子积累效应的临界值。还讨论了偏压,电极间隙和载流子累积效应之间的关系。 GaAs中深EL_2陷阱的浓度对GaAs PCSS的非线性模式有一定影响。

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