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III-Nitride Ultraviolet Photonic Materials ― Epitaxial Growth, Optical and Electrical Properties, and Applications

机译:III型氮化物紫外光子材料-外延生长,光学和电学性质及其应用

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This paper summarizes some of the recent advances made by our group on the growth, characterization and applications of AlGaN alloys with high Al contents. Recently, our group has achieved highly conductive n-type Al_xGa_(1-x)N for x as high as 0.7 (a resistivity value as low as 0.15 ohm-cm has been achieved). Prior to this, only insulating Al_xGa_(1-x)N (x > 0.5) can be obtained. Our success is largely attributed to our unique capability for monitoring the optical qualities of these layers - the development of the world's first (and presently only) deep UV picosecond time-resolved optical spectroscopy system for probing the optical properties of Ill-nitrides [photoluminescence (PL), electro-luminescence (EL), etc.] with a time-resolution of a few ps and wavelength down to deep UV (down to 195 nm). Our time-resolved PL results have shown that we must fill in the localization states (caused by alloy fluctuation) by doping before conduction could occur. The density of states of localization states is about 10~(18)/cm~3 in this system. It was also shown that Al_xGa_(1-x)N alloys could be made n-type for x up to 1 (pure A1N). Time-resolved photoluminescence (PL) studies carried out on these materials have revealed that Si-doping reduces the effect of carrier localization in Al_xGa_(1-x)N alloys and a sharp drop in carrier localization energy as well as a sharp increase in conductivity occurs when the Si doping concentration increases to above 1 x 10~(18) cm~(-3). For the Mg-doped Al_xGa_(1-x) N alloys, p-type conduction was achieved for x up to 0.27. The Mg acceptor activation energy as a function of Al content has been deduced. Mg-δ-doping in GaN and AlGaN epilayers has been investigated. We have demonstrated that δ-doping significantly suppresses the dislocation density, enhances the p-type conduction, and reduces the non-radiative recombination centers in GaN and AlGaN. A1N epilayers with high optical qualities have also been grown on sapphire substrates. Very efficient band-edge PL emission lines have been observed for the first time with above bandgap deep UV laser excitation. We have shown that the thermal quenching of the PL emission intensity is much less severe in A1N than in GaN and the optical quality of A1N can be as good as GaN. From the low temperature (10 K) emission spectra, as well as the temperature dependence of the recombination lifetime and the PL emission intensity, the binding energies of the bound excitons and free excitons in A1N were deduced to be around 16 meV and 80 meV, respectively. From this, the energy bandgap of A1N epilayers grown on sapphire was found to be around 6.11 eV at 10 K. The observed large free exciton binding energy implies that excitons in A1N are extremely robust entities. This together with other well-known physical properties of A1N may considerably expand future prospects for the application of III-nitride materials.
机译:本文总结了我们小组在高Al含量的AlGaN合金的生长,表征和应用方面取得的一些最新进展。最近,我们的研究小组获得了x高达0.7的高导电n型Al_xGa_(1-x)N(已经实现了低至0.15 ohm-cm的电阻率值)。在此之前,只能获得绝缘的Al_xGa_(1-x)N(x> 0.5)。我们的成功很大程度上归功于我们监测这些层的光学质量的独特能力-世界上第一个(目前也是唯一的)深紫外皮秒时间分辨光谱系统的开发,该系统用于探测for-氮化物的光学性质[光致发光( PL),电致发光(EL)等],具有几ps的时间分辨率,波长低至深紫外线(低至195 nm)。我们时间分辨的PL结果表明,在发生导电之前,必须通过掺杂来填充局部化状态(由合金涨落引起)。在该系统中,局域态的状态密度约为10〜(18)/ cm〜3。还显示出Al_xGa_(1-x)N合金可以制成x高达n的n型(纯AlN)。在这些材料上进行的时间分辨光致发光(PL)研究表明,Si掺杂降低了Al_xGa_(1-x)N合金中载流子局部化的影响,载流子局部化能急剧下降以及电导率急剧上升当Si掺杂浓度增加到1×10〜(18)cm〜(-3)以上时,会发生这种情况。对于掺Mg的Al_xGa_(1-x)N合金,x的p型导电率最高可达0.27。已经推断出作为Al含量的函数的Mg受体活化能。已经研究了GaN和AlGaN外延层中的Mg-δ掺杂。我们已经证明,δ掺杂可以显着抑制位错密度,增强p型传导,并减少GaN和AlGaN中的非辐射复合中心。具有高光学质量的AlN外延层也已经在蓝宝石衬底上生长。在上述带隙深紫外激光激发下,首次观察到非常有效的带边PL发射线。我们已经表明,Al的PL发射强度的热猝灭要比GaN严重得多,并且Al的光学质量可以和GaN一样好。从低温(10 K)发射光谱以及重组寿命和PL发射强度的温度依赖性,推论出AlN中结合的激子和自由激子的结合能分别为16 meV和80 meV,分别。由此发现,在蓝宝石上生长的A1N外延层的能带隙在10 K下约为6.11 eV。观察到的大的自由激子结合能表明A1N中的激子是非常坚固的实体。这与AlN的其他众所周知的物理特性一起可以大大扩展III族氮化物材料的应用前景。

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