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III-Nitride Ultraviolet Photonic Materials ― Epitaxial Growth, Optical and Electrical Properties, and Applications

机译:III-氮化物紫外线光子材料 - 外延生长,光学和电气性能和应用

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This paper summarizes some of the recent advances made by our group on the growth, characterization and applications of AlGaN alloys with high Al contents. Recently, our group has achieved highly conductive n-type Al_xGa_(1-x)N for x as high as 0.7 (a resistivity value as low as 0.15 ohm-cm has been achieved). Prior to this, only insulating Al_xGa_(1-x)N (x > 0.5) can be obtained. Our success is largely attributed to our unique capability for monitoring the optical qualities of these layers - the development of the world's first (and presently only) deep UV picosecond time-resolved optical spectroscopy system for probing the optical properties of Ill-nitrides [photoluminescence (PL), electro-luminescence (EL), etc.] with a time-resolution of a few ps and wavelength down to deep UV (down to 195 nm). Our time-resolved PL results have shown that we must fill in the localization states (caused by alloy fluctuation) by doping before conduction could occur. The density of states of localization states is about 10~(18)/cm~3 in this system. It was also shown that Al_xGa_(1-x)N alloys could be made n-type for x up to 1 (pure A1N). Time-resolved photoluminescence (PL) studies carried out on these materials have revealed that Si-doping reduces the effect of carrier localization in Al_xGa_(1-x)N alloys and a sharp drop in carrier localization energy as well as a sharp increase in conductivity occurs when the Si doping concentration increases to above 1 x 10~(18) cm~(-3). For the Mg-doped Al_xGa_(1-x) N alloys, p-type conduction was achieved for x up to 0.27. The Mg acceptor activation energy as a function of Al content has been deduced. Mg-δ-doping in GaN and AlGaN epilayers has been investigated. We have demonstrated that δ-doping significantly suppresses the dislocation density, enhances the p-type conduction, and reduces the non-radiative recombination centers in GaN and AlGaN. A1N epilayers with high optical qualities have also been grown on sapphire substrates. Very efficient band-edge PL emission lines have been observed for the first time with above bandgap deep UV laser excitation. We have shown that the thermal quenching of the PL emission intensity is much less severe in A1N than in GaN and the optical quality of A1N can be as good as GaN. From the low temperature (10 K) emission spectra, as well as the temperature dependence of the recombination lifetime and the PL emission intensity, the binding energies of the bound excitons and free excitons in A1N were deduced to be around 16 meV and 80 meV, respectively. From this, the energy bandgap of A1N epilayers grown on sapphire was found to be around 6.11 eV at 10 K. The observed large free exciton binding energy implies that excitons in A1N are extremely robust entities. This together with other well-known physical properties of A1N may considerably expand future prospects for the application of III-nitride materials.
机译:本文总结了本集团对高Al含量的增长,表征和应用的最新进展。最近,我们的组已经为x实现了高达0.7的高达0.7的高导电n型Al_xga_(1-x)n(实现了低至0.15欧姆-cm的电阻率值)。在此之前,只能获得仅绝缘AL_XGA_(1-x)n(x> 0.5)。我们的成功主要归因于我们监测这些层的光学品质的独特能力 - 世界上第一个(且目前仅)深紫外线蓄水时间分辨光谱系统,用于探测IIL-氮化物的光学性质[光致发光( PL),电 - 发光(EL)等,将几个PS和波长下降到深紫外线(下至195nm)的时间分辨率。我们的时间解决的PL结果表明,我们必须通过掺杂在发生之前填充本地化状态(由合金波动引起的)。本地化状态的状态的密度为该系统中约为10〜(18)/ cm〜3。还表明,可以使X型X型X型(纯A1N)进行N型(纯A1n)。在这些材料上进行的时间分辨的光致发光(PL)研究表明,Si-掺杂降低了载体定位在Al_xGa_(1-x)n合金中的影响,以及载体定位能量急剧下降以及导电性的急剧增加当Si掺杂浓度增加到高于1×10〜(18)cm〜(-3)时发生。对于Mg掺杂的Al_xGa_(1-x)n合金,X X型导通X至0.27°。已经推导出作为Al含量的函数的MG受体激活能量。已经研究了GaN和AlGaN脱落剂中的Mg-Δ掺杂。我们已经证明δ-掺杂显着抑制位错密度,增强了p型传导,并减少了GaN和AlGaN中的非辐射重组中心。具有高光学品质的A1N外膜也在蓝宝石基材上生长。首次观察到非常有效的带边缘PL发射线,并在上面的带隙深紫外激光激发中观察到。我们已经表明,PL发射强度的热淬火在A1N中比GaN中的重度得多严重,A1N的光学质量可以像GaN一样好。从低温(10K)发射光谱以及重组寿命和PL发射强度的温度依赖性,Defered激子和Pl发射强度的依赖性和PL发射强度的增合能量被推导出约16meV和80兆移动,分别。由此,发现在蓝宝石上生长的A1N外膜的能量带隙在10k下大约为6.11eV。观察到的大型自由激子结合能量意味着A1N中的激子是极其稳健的实体。这与A1N的其他众所周知的物理性质一起可以显着扩展应用III-氮化物材料的未来前景。

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