【24h】

Do we really need another PL study of CuInSe_2?

机译:我们真的需要对CuInSe_2进行另一项PL研究吗?

获取原文
获取原文并翻译 | 示例

摘要

A detailed composition, intensity and temperature dependent photoluminescence (PL) study of CuInSe_2 has been performed to obtain data on defects, directly comparable to the defects in CuGaSe_2, prepared under the same conditions. Epitaxial films are grown by metal organic vapour phase epitaxy on GaAs. The PL study reveals three shallow defects, which are responsible for the doping behaviour in CuInSe_2: two acceptors, 40 and 60 meV deep, and a donor, approximately 12 meV deep. The shallower acceptor dominates for low or no Cu-excess, whereas the deeper one dominates material grown under high Cu-excess. These defects and their compositional dependence are the same as observed in CuGaSe_2. Thus no fundamental difference concerning the shallow defects exists between these two materials.
机译:已对CuInSe_2进行了详细的成分,强度和温度依赖性光致发光(PL)研究,以获取与在相同条件下制备的CuGaSe_2中的缺陷直接可比的缺陷数据。外延膜是在GaAs上通过金属有机气相外延生长的。 PL研究揭示了三个浅缺陷,它们是CuInSe_2中掺杂行为的原因:两个受体,深度为40和60 meV,一个供体,深度为约12 meV。较浅的受体在低铜或无铜过量的情况下占主导地位,而较深的受体在高铜过量的情况下生长的材料占主导地位。这些缺陷及其组成依赖性与在CuGaSe_2中观察到的相同。因此,在这两种材料之间不存在关于浅缺陷的根本区别。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号