首页> 外文会议>Conference on Modeling, Signal Processing, and Control; 20040315-20040318; San Diego,CA; US >Model Development and Control Design for High Speed Atomic Force Microscopy
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Model Development and Control Design for High Speed Atomic Force Microscopy

机译:高速原子力显微镜的模型开发和控制设计

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This paper addresses the development of energy-based models and model-based control designs necessary to achieve present and projected applications involving atomic force microscopy. The models are based on a combination of energy analysis at the mesoscopic level with stochastic homogenization techniques to construct low-order macroscopic models. Approximate model inverses are then employed as filters to linearize transducer responses for linear robust control design.
机译:本文介绍了实现基于原子力显微镜的当前应用和计划应用所必需的基于能量的模型和基于模型的控制设计的开发。这些模型基于介观水平的能量分析与随机均质化技术的组合,以构建低阶宏观模型。近似模型逆然后用作滤波器以线性化传感器响应,以进行线性鲁棒控制设计。

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