首页> 外文会议>Conference on Microsystems Engineering: Metrology and Inspection Jun 20-21, 2001, Munich, Germany >Quantitative optical measurement of microcantilever vibration; Applications to near-field microsensors
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Quantitative optical measurement of microcantilever vibration; Applications to near-field microsensors

机译:微悬臂振动的定量光学测量;在近场微传感器中的应用

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Optical measuring techniques in Micro-electro-mechanical systems (MEMS) are attractive ways of detection and reproducible methods. Applications of appropriate optical measuring techniques can be found in many situations: local study of materials constants, characterization of micromechanical systems, vibration analysis, and environmental behavior... Following this evolution, we present some applications of a heterodyne optical measuring technique to the vibration analysis of microcantilevers. We have developed a micromechanical resonator made of a silicon cantilever associated with a small probe embedded at one end. The interaction of the probe with the investigated medium modifies the vibration characteristics of the microcantilever. In a first part we will see that a vibration analysis enables the characterization of local elastic constants of a solid sample with a good accuracy. The second part of the presentation describes a very interesting MEMS combining acoustics and optical sensing. A small vibrating sphere immersed in a liquid sample replaces the tip usually used in near-field acoustics. This vibrating microsensor is able to locally measure both density and viscosity of liquid samples. The third part is devoted to a dynamic electric system with optical detection allowing to perform measurement of topography and others physical properties such as the contact potential difference of the same sample surface, simultaneously. In the presented applications, microcantilevers are used in the design of the microsystems. We show that optical heterodyne detection is a powerful tool to quantify the frequency, the amplitude, the phase and the damping of the vibration, which are the pertinent parameters in these popular MEMS.
机译:微机电系统(MEMS)中的光学测量技术是有吸引力的检测方法和可重现方法。在许多情况下可以找到合适的光学测量技术的应用:材料常数的局部研究,微机械系统的表征,振动分析和环境行为...随着这种发展,我们介绍了外差光学测量技术在振动中的一些应用。微悬臂梁的分析。我们已经开发了一种由硅悬臂制成的微机械谐振器,该微悬臂与一端嵌入了一个小探针相关联。探针与被研究介质的相互作用改变了微悬臂梁的振动特性。在第一部分中,我们将看到振动分析使固体样品的局部弹性常数得以准确表征。演示的第二部分描述了一个非常有趣的MEMS,它结合了声学和光学传感技术。浸入液体样品中的小振动球代替了近场声学中通常使用的尖端。这种振动微传感器能够本地测量液体样品的密度和粘度。第三部分致力于具有光学检测功能的动态电气系统,该系统允许同时测量形貌和其他物理属性,例如同一样品表面的接触电势差。在提出的应用中,微悬臂梁用于微系统的设计。我们表明,光学外差检测是量化频率,振幅,相位和振动阻尼的有力工具,这是这些流行的MEMS中的相关参数。

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