首页> 外文会议>Conference on Micro- and Nanoelectronics; 20031006-20031010; Zvenigorod; RU >The investigations of ferroelectric thin films in virtual measuring system
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The investigations of ferroelectric thin films in virtual measuring system

机译:虚拟测量系统中铁电薄膜的研究

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We designed the laboratory automation for the ferroelectric thin films invesyigation, which differs from analogous by open architecture. This equipment is quite adopted with hardware and software of the leading companies (e.g., GPIB boards and LabView National Instruments) in the field of measuring technique and systems of data acquisition. It makes possible to carry out measuring of basic characteristics of ferroelectrics: studying the ferroelectric hysteresis, determining pyroelectric coefficient by static and quasy-static techniques, taking magnitude of remanent polarization, measuring dielectric constants, measuring the specimen electrical conductance. The measuring system has open architecture and it is easy to readjust it to solve specific problems including applications, for example, optimization of technological processes of ferroelectric films fabrication for memory devices or uncooled focal plane arrays. Basing on this measuring system there were developed several methods which give an opportunity to improve the comprehension of processes in ferroelectric systems from physical point of view.
机译:我们设计了用于铁电薄膜调查的实验室自动化系统,该实验室自动化系统不同于开放式架构。在测量技术和数据采集系统领域,该设备已被领先公司(例如GPIB板和LabView National Instruments)的硬件和软件所采用。可以进行铁电体基本特性的测量:研究铁电体磁滞,通过静态和准静态技术确定热电系数,测量剩余极化强度,测量介电常数,测量样品电导率。该测量系统具有开放式架构,易于调整以解决特定问题,包括应用,例如,优化存储设备或未冷却焦平面阵列的铁电薄膜制造工艺流程。基于该测量系统,开发了几种方法,这些方法从物理的角度为改善铁电系统中过程的理解提供了机会。

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