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Monolithic integration of RF-MEMS and semiconductor devices for the K-Band

机译:RF-MEMS和K波段半导体器件的单片集成

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In this paper a process for complete monolithic integration of semiconductor devices and radio-frequency micro-electro-mechanical systems (RF-MEMS) on a single substrate is presented. Our attempt was to combine RF-Schottky-Diodes to form sub-harmonic mixer and RF-MEMS-phaseshifters on a single chip. The diodes were etched from a molecular beam epitaxy grown silicon stack using two mesa etching steps. Nickel forms a nickel-silicon alloy (nickel silicide) during a rapid thermal processing step acting as Schottky-metallisation. On this stack, the RF-MEMS-fabrication starts with its metallisation layers as a back-end process. To insulate the relatively high actuation voltage (20-40 V) from the RF circuitry, a new concept for bias decoupling is presented. To demonstrate the functionality of the semiconductor integration approach, a mixer for 24 GHz has been designed in coplanar waveguide technology, the local oscillator frequency is at 12 GHz. Fabricated within the same run, switched line phaseshifters are used to show the MEMS capabilities. First tests of diodes revealed good results in their DC- and RF characteristics, the conversion loss of the subharmonic zero biased mixer reached 20 dB for 6 dBm power of the local oscillator. Fabricated teststructures of the phaseshifters achieved good results showing that transmission losses lower than 3dB at a phaseshift of 180°can be reached.
机译:在本文中,提出了在单个基板上完成半导体器件和射频微机电系统(RF-MEMS)的完整单片集成的过程。我们的尝试是将射频肖特基二极管结合在一起,以在单个芯片上形成次谐波混频器和射频微机电移相器。使用两个台面蚀刻步骤,从分子束外延生长的硅堆叠中蚀刻出二极管。镍在充当肖特基金属化的快速热处理步骤中形成镍硅合金(硅化镍)。在此堆栈上,RF-MEMS的制造始于其金属化层,这是后端过程。为了隔离来自射频电路的相对较高的驱动电压(20-40 V),提出了一种偏置去耦的新概念。为了演示半导体集成方法的功能,已经在共面波导技术中设计了24 GHz的混频器,本地振荡器频率为12 GHz。在同一行程中制造的开关线路移相器用于显示MEMS功能。二极管的首次测试显示了其直流和射频特性的良好结果,对于本地振荡器的6 dBm功率,次谐波零偏置混频器的转换损耗达到20 dB。移相器的预制测试结构取得了良好的结果,表明在180°的相移下,传输损耗可低于3dB。

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