A Systems Engineering Analysis of Image Quality

摘要

A linear systems approach (multiplying MTFs or convolving PSFs) to performing a complete systems engineering analysis of image is described. This includes not only the traditional diffraction analysis and the evaluation of image degradaton from residual design errors; but also includes image degradation due to scattering effects from residual optical fabrication errors, assembly and alignment errors, and all other potential error sources appearing in a detailed error budget tree. The effects of mosaic detector arrayss upon systems performance and the optimum system design will also be discussed. Thin analysis allows optical fabrication tolerances to be determined during the design phase of a program, frequently resulting in substantial cost and schedule savings. Inaccuracies in the linear systems assumption will be presented for several different applications.