首页> 外国专利> Quality influence factor analysis method, quality prediction method, quality control method, quality influence factor analysis device, quality prediction device, quality control device, quality influence factor analysis system, quality prediction system, quality control system, and computer program

Quality influence factor analysis method, quality prediction method, quality control method, quality influence factor analysis device, quality prediction device, quality control device, quality influence factor analysis system, quality prediction system, quality control system, and computer program

机译:质量影响因素分析方法,质量预测方法,质量控制方法,质量影响因素分析装置,质量预测装置,质量控制装置,质量影响因素分析系统,质量预测系统,质量控制系统和计算机程序

摘要

PPROBLEM TO BE SOLVED: To provide a quality effect factor analyzing method for clearing relation between data of conditions of manufacture obtained in a real situation and quality by using multivariate analysis, a quality forecasting method using an analysis result, a quality control method, a quality effect factor analyzing device, a quality forecasting device, a quality control device, a quality effect factor analyzing system, a quality forecasting system, a quality control system, and a computer program. PSOLUTION: N types of mutually correlating condition data indicating various conditions in manufacturing a product are converted into P types of components wherein N and P do not mutually correlate and NP (S14). P pieces of effect indexes indicating respective effect of the P types of the components on the quality are calculated by the multivariate analysis (S15). The P pieces of the effect indexes are converted into the N types of the condition data indicating the respective effect on the quality of the N types of the condition data (S16). The quality is forecasted and controlled by utilizing the analysis result. PCOPYRIGHT: (C)2005,JPO&NCIPI
机译:

要解决的问题:提供一种质量影响因子分析方法,以通过使用多变量分析来清除实际情况下获得的制造条件数据与质量之间的关系,使用分析结果的质量预测方法,质量控制方法,质量影响因子分析设备,质量预测设备,质量控制设备,质量影响因子分析系统,质量预测系统,质量控制系统和计算机程序。

解决方案:将表示产品制造中的各种条件的N种相互关联的条件数据转换为N和P不相互关联且N> P的P类组件(S14)。通过多变量分析计算出指示组分的P种类型对质量的各个影响的P个影响指标(S15)。将P个效果指标转换成表示对N种条件数据的质量的相应影响的N种条件数据(S16)。利用分析结果对质量进行预测和控制。

版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP4400253B2

    专利类型

  • 公开/公告日2010-01-20

    原文格式PDF

  • 申请/专利权人 住友金属工業株式会社;

    申请/专利号JP20040053572

  • 发明设计人 中川 義明;加納 学;

    申请日2004-02-27

  • 分类号G05B19/418;B21B37;

  • 国家 JP

  • 入库时间 2022-08-21 18:59:06

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