Performance study of hydrogen effect in Pd thin films irradiated by an UV irradiation

摘要

New studies concerning the performance of Pd films embedded with hydrogen are presented. The films were realized on Si wafers by thermal evaporation and soaked in hydrogen for different days. Every experiment processed two or more samples, one of which was irradiated by an excimer laser the day before its analysis. The laser fluence was lower than 25 mJ/cm~2 in order to avoid the film ablation and the maximum gas pressure was 5 bar. The samples were analysed by Scanning Electron Microscopy (SEM) and an electron microanalysis (EDX). Just after four processing days the films showed a morphological modification while with more than eight processing days new elements were observed, Na, S, Ca and Rn. The found elements were absent in the no-treated samples.