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DETERMINATION OF AVERAGE EFFECTIVE MASSES OFMAJORITY CARRIERS AS FUNCTION OF IMPURITY CONCENTRATIONS FOR HEAVILY DOPED GaAs

机译:用重掺杂GaAs的杂质浓度来确定主要载体的平均有效质量

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摘要

The average effective masses of majority carriers were calculated in heavily doped n- andp-type GaAs in the impurity concentration range from 10~(17) to 10~(20) cm~(-3) at room temperature. The connection between density of states and namowing of band gap was analyzed using kp-model. Calculated results were shown that the average effective masses of electrons and holes begin to increase for concentrations that are greater than concentrations at which Fermi levels enter the conduction band for n-type and the valence band in p-type GaAs.
机译:在室温下,在杂质浓度范围为10〜(17)至10〜(20)cm〜(-3)的重掺杂n型和p型GaAs中计算了多数载流子的平均有效质量。使用kp模型分析了状态密度与带隙束缚之间的联系。计算结果表明,与费米能级进入n型导带和p型GaAs价带的浓度相比,电子和空穴的平均有效质量开始增加。

著录项

  • 来源
    《CAS'95 proceedings》|1995年|103-106|共4页
  • 会议地点 Sinaia(RO);Sinaia(RO)
  • 作者

    Lj.D.Zivanov; M.B.Zivanov;

  • 作者单位

    Faculty of Technical Science, 21000 Novi Sad, Trg D.Obradovica 6, Yugoslvia;

    Faculty of Technical Science, 21000 Novi Sad, Trg D.Obradovica 6, Yugoslvia;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 半导体技术;
  • 关键词

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