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Improving the performance of light-sensitive developer-soluble anti-reflective coatings by using adamantyl terpolymers

机译:通过使用金刚烷基三元共聚物提高光敏性可溶于显影剂的增透膜的性能

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In a search for improved resolution and processing latitude for a family of light-sensitive developer-soluble bottom anti-reflective coatings (BARCs), the structure of the binder terpolymer was altered by incorporating acid-cleavable adamantyl methacrylates. Contrast curves and 193-nm microlithography were then used as tools in developing a novel developer-soluble adamantyl BARC which does not include a photoacid generator (PAG) or quencher, but instead depends on acid diffusing from the exposed resist for development. This formulation eliminates concern about PAG or quencher leaching out of the BARC during application of the photoresist. Resolution for a resist A and the new BARC was 150-nm L/S (1:1) for both 38-nm and 54- to 55-nm BARC thicknesses. Resolution and line shape were comparable to that of the non-adamantyl control BARC with same resist at 55-nm BARC thickness, with both BARCs giving some undercutting using an Amphibian™ XIS interferometer for the 193-nm exposures. Light-sensitive adamantyl BARCs that do require inclusion of a PAG for optimum lithography with resist A are also described in this paper. The series of developer-soluble adamantyl BARCs were solution and spin-bowl compatible. The 193-nm optical parameters (n and k) for all adamantyl BARCs were 1.7 and 0.5-0.6, respectively.
机译:为了寻求对光敏显影剂可溶的底部抗反射涂层(BARC)系列的改进的分辨率和加工范围,通过掺入酸可裂解的甲基丙烯酸金刚烷基酯来改变粘合剂三元共聚物的结构。然后,将对比曲线和193 nm光刻技术用作开发新型可溶于显影剂的金刚烷基BARC的工具,该显影剂不包含光酸产生剂(PAG)或淬灭剂,而是依靠从曝光的抗蚀剂中扩散出来的酸进行显影。该配方消除了在光致抗蚀剂施加过程中PAG或淬灭剂从BARC中浸出的担忧。对于38 nm和54至55 nm BARC厚度,抗蚀剂A和新型BARC的分辨率均为150 nm L / S(1:1)。在55 nm BARC厚度下,分辨率和线条形状与具有相同抗蚀剂的非金刚烷基对照BARC相当,两个BARC都使用Amphibian™XIS干涉仪对193 nm曝光进行了底切。本文还介绍了光敏的金刚烷基BARC,其确实需要包括PAG才能用抗蚀剂A进行最佳光刻。该系列可溶于显影剂的金刚烷基BARC具有溶液和旋转杯相容性。所有金刚烷基BARC的193 nm光学参数(n和k)分别为1.7和0.5-0.6。

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