Fringe Fingerprinting and Transmission Electron Goniometry, supporting Image-based Nanocrystallography in Two and Three Dimensions

摘要

Fringe fingerprinting and transmission electron goniometry when combined with high-resolution phase-contrast transmission electron microscopy (TEM) and atomic resolution scanning TEM (STEM) in the atomic number contrast mode offer the opportunity to develop dedicated methods for the crystallographic characterization of nanoparticles in two and three dimensions. This paper describes strategies for taking data from individual nanocrystals, so as to provide information on their three dimensional lattice as well as that of their structural defects. Internet based java applets that facilitate the application of transmission electron goniometry for cubic crystals with calibrated tilt-rotation and double-tilt holders are mentioned briefly. The enhanced viability of fringe fingerprinting and transmission electron goniometry in future aberration-corrected TEMs and STEMs is illustrated on a nanocrystal model system.