Dynamic Scaling in Feature Scale Simulations of Microstructure Evolution

摘要

Dynamic scaling parameters are used to characterize the evolution of grain structure in physical vapor deposition models and in experimental data obtained from atomic force microscopy. Surfaces are described in terms of a roughness exponent a, growth exponent β, and dynamic exponent z . The scaling exponents provide a valuable metric for comparative analysis and as a means of optimizing parameters used in the simulation.