Material Laboratory, Corporate RD center, Samsung SDI, 428-5, Gongse- dong, Giheung-gu, Yongin-si, Gyeonggi-do 446-577, Korea Phone:+82-31-2884616, E-mail: yury.matulevich@samsung.com;
rnMaterial Laboratory, Corporate RD center, Samsung SDI, 428-5, Gongse- dong, Giheung-gu, Yongin-si, Gyeonggi-do 446-577, Korea;
rnMaterial Laboratory, Corporate RD center, Samsung SDI, 428-5, Gongse- dong, Giheung-gu, Yongin-si, Gyeonggi-do 446-577, Korea;
rnMaterial Laboratory, Corporate RD center, Samsung SDI, 428-5, Gongse- dong, Giheung-gu, Yongin-si, Gyeonggi-do 446-577, Korea;
rnMaterial Laboratory, Corporate RD center, Samsung SDI, 428-5, Gongse- dong, Giheung-gu, Yongin-si, Gyeonggi-do 446-577, Korea;
exoelectron emission; photoemission; scandium; MgO;
机译:掺铝MgO表面层的MgO / Au复合膜的二次电子发射特性分析
机译:掺Sc和Zr的MgO层对交流等离子体显示面板电子发射和放电特性的影响
机译:交流等离子显示面板中具有微观表面结构的MgO保护层的离子诱导二次电子发射系数(γ)
机译:SC掺杂对MgO保护层电子发射性能的影响
机译:纳米层掺杂铝的氧化锌的发光性质
机译:金掺杂对MgO薄膜二次电子发射性能的影响
机译:用Al掺杂MgO表面层分析MgO / Au复合膜的二次电子发射性能