Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong;
Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong;
Academia Sinica, Institute of Information Science, Taipei, Taiwan;
Flash memories; Three-dimensional displays; Sensors; Parity check codes; Error correction; Programming; Optimization;
机译:优化寿命容量和比特可改变的3-D NAND闪光的读取性能
机译:通过利用错误位置来提高NAND Flash SSD的读取性能
机译:虚拟读取方案可终身改善MLC NAND闪存
机译:两个世界中最好的:在利用位可变的NAND闪光灯中的生命周期和阅读性能优化
机译:基于NAND闪存的固态驱动器的性能和可靠性研究与探索。
机译:CMOS兼容的铁电NAND闪存用于高密度低功耗和高速三维内存
机译:NaND闪存控制器跨层优化的性能和可靠性分析