首页> 外文会议>42nd international symposium on microelectronics (IMAPS 2009) >A Comparative Study of Microstrip, Stripline and Coplanar Lines on Different Substrate Technologies for High-Performance Applications
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A Comparative Study of Microstrip, Stripline and Coplanar Lines on Different Substrate Technologies for High-Performance Applications

机译:高性能应用中不同基板技术上微带线,带状线和共面线的比较研究

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摘要

This paper presents a comparative study of the losses of 4 commonly used planar transmission linesrn(microstrip, coplanar, grounded coplanar and stripline). The losses are separated into conductor dielectric andrnradiation losses and investigated on 3 different technologies. These technologies are thin-film polymer substrate, lowrncost printed circuit board and glass. The attenuation on these 4 lines is computed using quasi-static methods and fullrnwave simulations. The goal is to get an insight on the different frequency-dependent behaviour of the lines to providernthe optimal line configuration for a given substrate technology and frequency region.
机译:本文对四种常用的平面传输线(微带,共面,接地共面和带状线)的损耗进行了比较研究。损耗分为导体介电损耗和辐射损耗,并通过3种不同的技术进行了研究。这些技术是薄膜聚合物基板,低成本印刷电路板和玻璃。使用准静态方法和全波仿真计算这4条线上的衰减。目的是深入了解线的不同频率相关行为,以提供给定基板技术和频率区域的最佳线配置。

著录项

  • 来源
  • 会议地点 San Jose CA(US);San Jose CA(US)
  • 作者单位

    Fraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany Phone: Tel. +493046403189, Fax +493046403158rnEmail: robert.erxleben@izm.fraunhofer.de;

    rnFraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany;

    rnFraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany;

    rnFraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany;

    rnFraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany;

    rnFraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany;

    rnFraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany;

    rnFraunhofer Institute of Reliability and Microintegration Gustav-Meyer-Allee 25, Berlin, Berlin 13355 Germany Technische Universit?t Berlin (Berlin Institute of Technology)rnStra?e des 17. Juni 135, 10623 Berlin, Germany;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 微电子学、集成电路(IC);
  • 关键词

    planar transmission lines; microstrip; coplanar; stripline; attenuation;

    机译:平面传输线;微带;共面;带状线;衰减;

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