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Effect of Heavy Doping on Dark Conductivity of TBP Doped n-Type a-Si:H Films

机译:重掺杂对TBP掺杂n型a-Si:H薄膜暗导电性的影响

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The temperature dependence of dc dark conductivity has been examined in n-type tertiarybutylphosphine (TBP) doped a-Si:H films deposited by glow discharge technique. The conductivity of doped a-Si:H is observed to be very sensity to the rate at which the sample is cooled following a high temperature anneal. The conductivity is found to be thermally activated. The Arrhenius plots of the conductivity Vs temperature show a kink at a particular temperature which varies with the doping concentration. At higher doping levels TBP/SiH_4=3 percent), the kink disappears probably due to thermal stability of the films.
机译:在通过辉光放电技术沉积的n型叔丁基膦(TBP)掺杂的a-Si:H薄膜中,已经检验了dc暗电导率的温度依赖性。观察到掺杂的a-Si:H的电导率对高温退火后样品的冷却速率非常敏感。发现导电性被热活化。电导率Vs温度的Arrhenius图显示了在特定温度下的扭结,该扭结随掺杂浓度而变化。在较高的掺杂水平TBP / SiH_4 = 3%时,扭结消失的原因可能是薄膜的热稳定性。

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