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Study of photoconductivity in TBP doped n-type hydrogenated amorphous silicon using Argon as carrier gas

机译:氩气作为载气在TBP掺杂n型氢化非晶硅中的光电导性研究

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摘要

In the present paper, photoconductivity, sigma(ph), of n-type a-Si:H films, obtained by using tertiarybutylphosphine (TBP) as a dopant are reported. The films were obtained by adding TBP vapour to silane (SiH4) gas in ratios varying from 10(-3)% to 3% in an rf glow discharge (plasma lab mu P) process using Ar as the carrier gas. Room temperature photoconductivity is found to initially increase with dopant concentration, is a maximum for TBP/SiH4 ratio near 10(-2)% and decreases as the TBP/SiH4 ratio is increased from 10(-1)% to 3%. A correlation is found to exist between photoconductivity and position of the dark Fermi level. Photosensitivity is found to increase as the TBP/SiH4 ratio increases from 10(-3)% to 10(-2)% and decrease as the dopant concentration is increased to 1%, but for a heavily doped sample (TBP/SiH4 = 3%) the photosensitivity is found to increase again. The temperature variation of photoconductivity is measured over the temperature range 190 to 400 K. The intensity dependence of the photoconductivity indicates the existence of bimolecular recombination. The spectral response of the photoconductivity is qualitatively similar for different doping ratios. A peak is observed at an energy of 2.0 eV for all the samples. (C) 1998 Elsevier Science B.V. All rights reserved. [References: 17]
机译:在本文中,报道了通过使用叔丁基膦(TBP)作为掺杂剂获得的n型a-Si:H薄膜的光电导率σ(ph)。通过在使用Ar作为载气的rf辉光放电(等离子实验室μP)工艺中将TBP蒸气以10(-3)%到3%的比率添加到硅烷(SiH4)气体中来获得薄膜。发现室温光电导率最初随掺杂剂浓度而增加,是TBP / SiH4比率在10(-2)%附近的最大值,并且随着TBP / SiH4比率从10(-1)%增加到3%而降低。发现光电导率与暗费米能级的位置之间存在相关性。发现光敏性随着TBP / SiH4比从10(-3)%增加到10(-2)%而增加,并随着掺杂剂浓度增加到1%而降低,但是对于重掺杂样品(TBP / SiH4 = 3 %)发现光敏性再次增加。在190至400 K的温度范围内测量光电导率的温度变化。光电导率的强度依赖性表明存在双分子重组。对于不同的掺杂比,光电导的光谱响应在质量上相似。对于所有样品,在能量为2.0 eV时观察到一个峰。 (C)1998 Elsevier Science B.V.保留所有权利。 [参考:17]

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