首页> 外文会议>3rd European Conference on Silicon Carbide and Related Materials, ECSCRM2000 September 3-7 2000 Kloster Banz, Germany. >Valence Band Splittings of 15R SiC Measured using Wavelength Modulated Absorption Spectroscopy
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Valence Band Splittings of 15R SiC Measured using Wavelength Modulated Absorption Spectroscopy

机译:波长调制吸收光谱法测量15R SiC的价带分裂

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15R SiC has significant advantages over 4H and 6H SiC for certain device applications. We have measured the free exciton low temperature photoluminescence (LTPL) spectrum for E perpendicular c and the wavelength derivative of the absorption coefficient dalpha/dlambda of 15R SiC for both polarizations E perpendicular c and E || c using modulation absorption spectroscopy. We use the E perpendicular c intrinsic 2 K photoluminescence spectrum to make assignments to features in the E perpendicular c absorption derivative spectrum. We obtain 7.15+-0.25 meV for the spin orbit splitting, in agreement with previous work, but with improved precision. The determination of the crystal field splitting is more challenging. We argue for a value of about 51 meV. This value is in good agreement with recent calculations.
机译:在某些器件应用中,15R SiC具有优于4H和6H SiC的显着优势。我们已经测量了E垂直c的自由激子低温光致发光(LTPL)光谱和E垂直c和E偏振的15R SiC的吸收系数dalpha / dlambda的波长导数。 c使用调制吸收光谱法。我们使用E垂直c本征2 K光致发光光谱对E垂直c吸收导数光谱中的特征进行分配。与先前的工作一致,但自旋轨道分裂获得7.15 + -0.25 meV,但精度有所提高。晶体场分裂的确定更具挑战性。我们认为其值约为51 meV。该值与最近的计算非常吻合。

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