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Analytical study of double gate MOSFET: A design and performance perspective

机译:双栅极MOSFET的分析研究:设计和性能观点

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This paper presents an in depth study and analysis which shows that the Double gate MOSFET has emerged as one of the most favorable devices due to short channel effect immunity, off-current reduction ability and more scaling possibility. The devices with less than 0.1 μm gate length can maintain near ideal subthreshold factor. This paper also presents some new modifications in the existing devices, in order to keep up with the performance improvements, such as Asymmetric Undoped Double gate MOSFET, Symmetric and Asymmetric Underlap Double gate MOSFET, high K TMDG MOSFET, high K Spacer Asymmetric Underlap Double gate MOSFET, Graded Channel Double gate MOSFET and Dual-insulator Double gate MOSFET.
机译:本文进行了深入的研究和分析,结果表明,由于短沟道效应抗扰性,降低断流能力和更大的缩放可能性,双栅极MOSFET已成为最有利的器件之一。栅极长度小于0.1μm的器件可以保持接近理想的亚阈值系数。本文还提出了对现有器件的一些新修改,以跟上性能改进的步伐,例如不对称非掺杂双栅极MOSFET,对称和不对称下重叠双栅极MOSFET,高K TMDG MOSFET,高K垫片非对称下重叠双栅极MOSFET,渐变通道双栅极MOSFET和双绝缘体双栅极MOSFET。

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