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Production challenges of TSOP Copper wire bonding

机译:TSOP铜线键合的生产挑战

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With the Copper wire bonding already occupying majority of production lines, there are many significant factors continue to surface out. The Copper wire bonding has also becomes very susceptible to production variability of small leaded packages such as Thin Small Outline Package (TSOP). The TSOP utilizes thin and flimsy leadframes, causing a lot challenges at 2nd bond (stitch). The stitch bonding shows high occurrences of pre-mature failures or wire breaks, while struggling to maintain good stitch bonding strength. Furthermore, the inconsistent stitch bonding can also cause inconsistent tail formation, subsequently affecting the formation of Free Air Ball (FAB) and 1st bond quality. With many DOEs (Design of Experiments), several improvements were executed to address the stitch forming issues. Some of these major actions include optimizing several parameters such as the 2nd bond force, wire looping speed, wire loop mode change and wire sequencing. However, even with the implementation of these improvement actions, the Copper wire bonding performance was only improved by 50%. More comprehensive mapping was extended into possible impact of leadframe location and design. Surprisingly, die attach process was found to be the confounding with the leadframe design. It looks like wire stitch formation at ground lead is not consistent, mostly affected by the die attach epoxy bleed and outgas. In order to obtain more robust Copper wire bonding performance, the die attach process was optimized accordingly. Without losing any die attach quality, optimized process provided much larger operating margin for Copper wire bonding. All the combined improvements managed to eliminate wire break occurrence, while maintaining the good bonding strength of 1st and 2nd bonds. The lessons learnt were very important and already embedded to all new Copper wire bonding projects in order to realize 1st pass success into production mode.
机译:铜线键合已经占据了生产线的大部分,因此许多重要因素继续浮出水面。铜线键合也变得非常容易受到诸如薄小外形封装(TSOP)之类的小引线封装的生产变化的影响。 TSOP采用了薄而脆弱的引线框架,在第二键合(缝合)时会带来很多挑战。针脚粘接显示过早发生故障或断线,同时努力保持良好的针脚粘接强度。此外,不一致的针脚粘合也会导致不一致的尾部形成,从而影响自由空气球(FAB)的形成和第一粘合质量。对于许多DOE(实验设计),已进行了多项改进以解决针迹形成问题。这些主要动作中的一些动作包括优化几个参数,例如第二键合力,线环速度,线环模式改变和线序。但是,即使实施了这些改善措施,铜线键合性能也仅提高了50%。更全面的映射扩展到引线框位置和设计的可能影响。令人惊讶的是,发现芯片贴装工艺与引线框设计混杂在一起。看起来接地引线处的线迹形成不一致,主要受芯片附着环氧树脂渗漏和脱气影响。为了获得更强大的铜线键合性能,相应地优化了芯片贴装工艺。在不损失任何管芯附着质量的情况下,优化的工艺为铜线键合提供了更大的操作余量。所有这些综合的改进设法消除了断线的发生,同时保持了第一键和第二键的良好粘合强度。所汲取的经验教训非常重要,并且已经嵌入到所有新的铜线键合项目中,以实现第一次成功进入生产模式。

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