Aggregate path Monte-Carlo method for single electron circuit simulations

摘要

For the simulation of single electronic circuits, the standard Monte Carlo method traces the tunnel events across the nodes of the circuit. This paper presents a Monte-Carlo method based on the analytical distribution of the time between successive tunnel events across the given junction. The method is used to compute the steady state characteristics and the Fano factor. The method is shown to be superior for larger circuits under lower bias conditions.