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Analytical study of complementary memristive synchronous logic gates

机译:互补忆阻同步逻辑门的分析研究

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This paper describes an analytical study of synchronous logic gate design based on hybrid structure with MOS and resistive switching non-volatile memories (RS-NVMs). This type of structure allows ultra-low power consumption during power down, while often-used data are saved in RS-NVM cells. The parallel data sensing achieves low-power and fast computation time. The logic gate construction theory, from Boolean equation to hybrid MOS/RS-NVM tree, is deeply detailed. Read and write design guideline, regarding RS-NVM and MOS resistance balance are investigated. Practical implementation is given through transient simulations based on two memory technologies: STT-MRAM and OxRRAM to validate the concept by using CMOS 40 nm design kit and memory compact models.
机译:本文介绍了一种基于MOS与电阻切换非易失性存储器(RS-NVM)混合结构的同步逻辑门设计的分析研究。这种类型的结构允许在断电期间实现超低功耗,同时将常用数据保存在RS-NVM单元中。并行数据检测实现了低功耗和快速的计算时间。从布尔方程到MOS / RS-NVM混合树,逻辑门的构建理论得到了详尽的阐述。研究了关于RS-NVM和MOS电阻平衡的读写设计指南。通过基于两种内存技术的瞬态仿真给出了实际的实现方法:STT-MRAM和OxRRAM,以通过使用CMOS 40 nm设计套件和内存紧凑模型来验证这一概念。

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