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The calculation model of the shielding failure trip-out rate of double-circuit transmission line on the same tower

机译:同塔双回输电线路屏蔽故障跳闸率的计算模型

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Electric geometry method(EGM) was used to calculate the shielding failure trip-out rate of double-circuit transmission line on the same tower in the thesis, with striking distance factor β that conforms to the height of tower changes being introduced and the lightning current obtained when the exposure arc was 0 being considered the strongest shielding failure current. Next analysis was made of effects of various factors like the ground inclined angle, tower structure and so forth on shielding failure trip-out rate of each phase conductor. Finally the calculation results showed as follows: the shielding failure trip-out rate increased first then decreased as the ground inclined angle increased; the shielding failure trip-out rate decreased as the horizontal interval between double shielding wires increased; the complicated relation between shielding failure trip-out rate and tower structure of each phase conductor indicated a respective calculation and analysis rather than a total shielding failure trip-out rate.
机译:本文采用电几何方法(EGM),计算了同塔双回输电线路的屏蔽故障跳闸率,引入了与塔高变化一致的雷击距离因子β,并引入了雷电流。当曝光弧为0时获得的最大屏蔽失效电流。接下来分析了诸如接地倾斜角,塔架结构等各种因素对每相导体的屏蔽故障跳闸率的影响。最终计算结果表明:随着接地倾斜角的增大,屏蔽故障跳闸率先增大后减小。随着双屏蔽线之间的水平间隔增加,屏蔽故障跳闸率降低;屏蔽故障跳闸率与每相导体塔架结构之间的复杂关系表明了各自的计算和分析,而不是总的屏蔽故障跳闸率。

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