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Characterization of thermally conductive underfill materials for high performance flip-chip applications

机译:高性能倒装芯片应用的导热底部填充材料的特性

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In this paper, characterization of 3 types of underfill for high performance applications has been presented. Characterizations of underfill materials such as adhesion testing, contact angle measurement on different surfaces, filler size distribution were conducted to understand the underfill materials. The adhesion test results revealed that failure is mainly mixed mode, which is the failure between bulk underfill failure and interfacial failure. The thermal conductive underfill has a wider range of filler sizes and has the most hydrophilic behavior. From the glass chip flow test, the flow behavior of the underfill could be observed, with the most thermal conductive underfill having the slowest flow. Process optimization for thermal chip and daisy chain chip for void free underfill was also carried out based on dispensing temperature and patterns.
机译:本文介绍了针对高性能应用的3种底部填充剂的表征。进行了底部填充材料的表征,例如附着力测试,在不同表面上的接触角测量,填料尺寸分布,以了解底部填充材料。附着力测试结果表明,失效主要是混合模式,即本体底部填充失效和界面失效之间的失效。导热性底部填充剂的填充剂尺寸范围更广,并且具有最亲水的行为。从玻璃屑流动测试中,可以观察到底部填充剂的流动行为,其中导热性最强的底部填充剂流动最慢。还基于分配温度和图案对热芯片和菊花链芯片进行了工艺优化,以实现无空隙的底部填充。

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