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Development of a high-pressure CdS sputtering process for improved efficiency in CIGS-based photovoltaic devices

机译:开发高压CdS溅射工艺以提高基于CIGS的光伏器件的效率

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A new sputtered process for cadmium sulfide (CdS) has been developed that boosted efficiency of a PV device baseline (with single-stage, coevaporated CIGS) by ∼ 2.7% (absolute) to an average of ∼10%. The process is highly scalable to a roll-to-roll environment, with the maximum efficiency effect occurring at 0.1 mbar (∼75 mTorr) sputtering pressure. The efficiency improvement is thought to be due to two main factors: composition and defects. The CdS film deposited at high pressure (HP) contains more oxygen (primarily as CdO) than one deposited at typical pressures, with oxygen content higher towards the CdS-CIGS interface. The HP process produces an interface with less CdS-CIGS intermixing, which results in a junction with ∼ 5x fewer defects as measured by admittance spectroscopy. The performance improvement due to HP CdS occurs even with a very thin CdS layer (< 15 nm), thus greatly reducing the total amount of cadmium contained in the cells.
机译:已开发出一种新的硫化镉溅射工艺(CdS),可将PV设备基线(单级共蒸发CIGS)的效率提高约2.7%(绝对值)至平均约10%。该方法在卷对卷环境中具有高度可扩展性,在0.1 mbar(〜75 mTorr)的溅射压力下可获得最大的效率效果。效率的提高被认为是由于两个主要因素造成的:组成和缺陷。与在典型压力下沉积的氧相比,在高压(HP)沉积的CdS膜中所含的氧(主要为CdO)要多,而朝向CdS-CIGS界面的氧含量更高。高压工艺产生的界面具有较少的CdS-CIGS混合,这导致结处的导纳光谱测定的缺陷少约5倍。即使使用非常薄的CdS层(<15 nm),由于HP CdS而导致的性能改善也会发生,因此大大减少了电池中所含镉的总量。

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