A Phase Error Compensation for Structured Light 3D Profile Measurement

摘要

A structured light system composed of the digital devices and phase-shifting method is widely used for the accurate three-dimension profile measurement. However, the nonlinear gamma error and harmonics error of the digital devices, especially the projector, will cause the captured fringe patterns to be non-sinusoidal waveforms, which lead to an additional phase error and therefore measurement error. A novel and convenient phase error compensation method is proposed here. Experiments show that this error compensation method can be used for effective phase error compensation in practical three-dimension profile measurement. reduce the phase error at least 40 times smaller.