首页> 外文会议>2003 International Electronic Packaging Technical Conference and Exhibition; Jul 6-11, 2003; Maui, Hawaii >THE EFFECT OF MULTIPLE REFLOW TIMES ON LEAD-FREE SOLDER JOINT MICROSTRUCTURE
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THE EFFECT OF MULTIPLE REFLOW TIMES ON LEAD-FREE SOLDER JOINT MICROSTRUCTURE

机译:多次回流时间对无铅焊接接头组织的影响

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As environmental issues are raising more interest and are becoming crucial factors in all parts of the world, more and more environmental-friendly electronics products are emerging. Usually this means the introduction of products with lead-free solders. However, the reliability of lead-free solders is still a serious concern despite the vast research done in this field. This paper will describe the interconnect reliability of three kinds of solder joints respectively prepared with lead-free solder paste and lead-free PBGA components, lead-free solder paste and tin-lead-silver PBGA components, and tin-lead solder paste and tin-lead-silver PBGA components. Lead-free and tin-lead solders were composed of eutectic tin-silver-copper and tin-lead, respectively. In addition, the study also presents the effect of multiple reflow times. The study focuses on the microstructures of different assemblies. The particular interest is on the assemblies soldered with lead-free solder paste and tin-lead-silver PBGA components, since the SnPbAg solder on the bumps of the PBGA components were exposed to the reflow profile meant for the lead-free SnAgCu solder. Thus, these SnPbAg solder bumps were in the molten state almost twice as long as the rest of the solders. This had a notable effect on the reliability of these solder joints as we will be showing later in this paper. The test boards were temperature-cycled for 2500 cycles between -40 and +125℃ (a 30-minute cycle). PBGA solder joint failures were monitored with a real time monitoring system. Optical and scanning electron microscopy was used to inspect the broken solder joints and their microstructure. The results of tests indicate that the number of reflow times can significantly affect the lifetime of PBGA solder joints. The most notable changes can be seen in the solder joints made with tin-lead-silver PBGA components and tin-silver-copper solder paste soldered with a lead-free reflow profile. The general trend was that the reliability of the solder joints increased in proportion to the number of reflow times. Mainly two factors are believed to have the major effect on the reliability of PBGA solder joints, voids, and microstructural changes in solder.
机译:随着环境问题在世界各地引起越来越多的关注并成为关键因素,越来越多的环保电子产品正在涌现。通常,这意味着要引入无铅焊料产品。然而,尽管在该领域进行了大量研究,但无铅焊料的可靠性仍然是一个严重的问题。本文将描述分别使用无铅焊膏和无铅PBGA组件,无铅焊膏和锡-铅-银PBGA组件以及锡-铅焊膏和锡制成的三种焊点的互连可靠性。 -铅银PBGA组件。无铅和锡铅焊料分别由共晶锡银铜和锡铅组成。此外,该研究还提出了多次回流时间的影响。该研究集中于不同组件的微观结构。特别关注的是用无铅焊膏和锡铅银PBGA组件焊接的组件,因为PBGA组件凸块上的SnPbAg焊料暴露于用于无铅SnAgCu焊料的回流曲线。因此,这些SnPbAg焊料凸点处于熔融状态的时间几乎是其余焊料的两倍。这将对这些焊点的可靠性产生显着影响,我们将在本文稍后展示。将测试板在-40至+125℃的温度下进行2500次循环(30分钟循环)。 PBGA焊点故障通过实时监控系统进行监控。使用光学和扫描电子显微镜检查断裂的焊点及其微观结构。测试结果表明,回流次数会严重影响PBGA焊点的寿命。从锡铅银PBGA组件和锡银无铅回流焊锡银铜焊料制成的焊点中可以看到最显着的变化。总的趋势是,焊点的可靠性与回流时间的数量成比例地增加。据信,主要有两个因素对PBGA焊点的可靠性,空隙和焊料的微观结构变化有重要影响。

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