首页> 外文会议>18th Annual Semiconductor Pure Water and Chemicals Conference, 18th, Mar 1-4, 1999, Santa Clara, California >Removal of Photoresist with Ozonated DI Water in a Centrifugal Spray Processor
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Removal of Photoresist with Ozonated DI Water in a Centrifugal Spray Processor

机译:在离心喷雾处理器中用臭氧水去除光致抗蚀剂

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Room-temperature super-saturated ozonated DI water has been used in a spray processor to efficiently strip photoresist from semiconductor wafers. Recently-available technology has been implemented to dissolve ozone in room-temperature DI water at concentrations up to 120 ppm. The supersaturated ozonated water has been used to strip hard-baked photoresist, low-dosage ion-implanted photoresist and plasma-exposed photoresist. It has also been used to strip photoresist in the presence of exposed aluminum. The destruction of dissolved ozone that is normally catalyzed by exposure to metal has been counteracted by the addition of dilute ammonium bicarbonate.
机译:室温超饱和臭氧化去离子水已用于喷雾处理器中,以有效地从半导体晶圆上剥离光刻胶。已经实施了最近可用的技术,以将臭氧溶解到室温去离子水中的浓度高达120 ppm。过饱和的臭氧水已被用于剥离硬烘烤的光刻胶,低剂量离子注入光刻胶和等离子体曝光的光刻胶。它也已经用于在暴露的铝存在下剥离光刻胶。溶解的臭氧的破坏(通常是通过暴露于金属来催化)已通过添加稀碳酸氢铵来抵消。

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