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An internal electrostatic charging test of circuit boards under electron beam

机译:电子束对电路板的内部静电测试

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Circuit boards with a grounded strip and a floating square trace were irradiated by a 0.85 MeV electron beam at the JPL Dynamitron. The potential on the floating square was monitored by measuring the current through a shunt resistor with very high resistance of 100 TΩ. The effects of a ground plane on the back of PCB and an exposed dielectric area on the potential of floating square were studied by testing corresponding circuit boards. The measured voltages were then compared with the simulated ones using a newly developed 3-D code, CB_IESD.
机译:在JPL Dynamitron上,用0.85 MeV电子束辐照了具有接地条和浮动方形迹线的电路板。通过测量流过并联电阻的电流来监控浮动方块上的电位,该电阻的电阻非常高,为100TΩ。通过测试相应的电路板,研究了PCB背面的接地层和裸露的电介质区域对浮动方形电位的影响。然后使用新开发的3-D代码CB_IESD将测得的电压与模拟电压进行比较。

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