Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis

摘要

A non-scan design for testability method for RTL circuits based on conflict analysis is proposed. Conflict analysis is presented based on a new 5-valued system to estimate testability of data paths. New test point structures for RTL circuit design for testability are introduced. Non-scan design for testability is proposed based on conflict resolution. Unlike most of the previous methods, our method considers testability of data paths and the controller simultaneously. Different classes of test points can be inserted into data paths and the controller. Intensive techniques arc presented to connect extra inputs of test points with PI ports, which avoids generating reconvergent fanouts that cause new conflicts.