首页>
外国专利>
A method of forming a seed layer on a high aspect ratio via and a semiconductor device having a high aspect ratio via
A method of forming a seed layer on a high aspect ratio via and a semiconductor device having a high aspect ratio via
展开▼
机译:一种通过高纵横比形成种子层的方法和通过高纵横比形成具有高纵横比的半导体器件的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method of forming a seed layer on a high aspect ratio via (12), comprising: preparing a substrate (10, 30) having a via (12); and forming a seed layer (60) on the substrate (10, 30), wherein forming the seed layer (60) by a tilting motion for tilting the substrate (10, 30) forward, backward, left and right and rotating the substrate is performed such that a material (50) for forming the seed layer (60) is deposited at a predetermined angle θ or less and a change in direction of the substrate (10, 30) is intermittent or continuous, the through hole (12) being so configured , that a cross-sectional area of a through-hole opening after forming the seed layer is 50% or more compared to the state before forming the seed layer (60), viewed from above, characterized in that.a Mo seed layer and a Cu seed layer through successively Sputtering is applied so that a Mo seed layer and a Cu seed layer are alternately stacked to form a multilayer structure having a plurality of Mo cores m layers and Cu seed layers, wherein the forming of the seed layers (60) is performed by applying a target power of 2 ~ 5 kW, and wherein the through hole (12) is configured so that an average depth is at least 10 times an average width , based on its cross section.
展开▼