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DESIGN APPLICATIONS OF BURIED POWER RAILS

机译:埋设电源轨的设计应用

摘要

A semiconductor device includes a substrate, one or more transistors, a metal layer, one or more buried power rails, and at least one wall-via structure. The transistors and the metal layer are manufactured above a top surface of the substrate. The buried power rails are in one or more corresponding trenches in the substrate below the top surface of the substrate. At least one wall-via structure extends between the first buried power rail and the metal layer and electrically connects the first buried power rail to the metal layer. The wall-via structure includes a plurality of intermediate metal layers sandwiched between the first buried power rail and the metal layer. Alternatively, the wall-via structure includes a length that is greater than or equal to four times a basic length unit for components in layers between the first buried power rail and the metal layer for the semiconductor device.
机译:半导体器件包括基板,一个或多个晶体管,金属层,一个或多个掩埋电源轨,以及至少一个壁结构。 晶体管和金属层制造在基板的顶表面上方。 掩埋电源轨在基板的顶表面下方的基板中是一个或多个相应的沟槽。 至少一个壁通过结构在第一掩埋电源轨和金属层之间延伸,并将第一掩埋电源轨电连接到金属层。 壁通孔结构包括夹在第一掩埋电源轨和金属层之间的多个中间金属层。 或者,壁通孔结构包括长度大于或等于用于半导体器件的第一掩埋电源轨和金属层之间的层的基本长度单元的基本长度单元的长度。

著录项

  • 公开/公告号US2022068815A1

    专利类型

  • 公开/公告日2022-03-03

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US202117521835

  • 发明设计人 VASISHT M. VADI;

    申请日2021-11-08

  • 分类号H01L23/528;H01L27/02;H01L23/522;

  • 国家 US

  • 入库时间 2022-08-24 23:42:38

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