Method for Calculating Depth of Defect Determined by System for Inspecting Defects of Structure By Use of X-ray

摘要

The present invention relates to an X-ray generator that moves so as to irradiate X-rays to a structure by a first movement device, and a second movement device that generates and detects X-rays that have passed through the structure by the X-ray generator. A method for calculating the depth of a defect detected by a defect inspection system of a structure including an X-ray detector and a control unit and a defect determination unit, the method comprising: controlling the control unit to move the first moving device to a predetermined position a first step of sending a command to a first mobile device; a second step of, by the control unit, driving the second moving device to a position where the X-ray generator can detect the X-rays that have passed through the structure by irradiating the X-ray generator at the position; a third step of the control unit transmitting a control command to the X-ray generator so that the X-ray generator irradiates the structure with X-rays at the position; A fourth step of receiving, by the inspection record receiving apparatus, an X-ray image from the X-ray detector; a fifth step of determining, by the determination device, a defect of the structure based on the received X-ray image; If it is determined that there is a defect in the fifth step, the control unit issues a control command to move the first moving device so that the X-ray generating device can image the defect at a first position that is substantially the same height as the defect imaging position but is different a sixth step of transmitting to the first mobile device; a seventh step of the control unit sending a control command to the X-ray generator to photograph the defect at a first position; The control unit receives a control command for moving the first moving device so that the X-ray generator can image the defect at a second position opposite to the first position based on the defect imaging position and substantially at the same height as the defect imaging position an eighth step of transmitting to the first mobile device; a ninth step of sending, by the control unit, a control command to the X-ray generating device to photograph the defect at a second position; The defect determination unit determines the depth of the defect (A is the movement distance of the X-ray focus between the first and second positions; B is the movement distance of the defect image on the X-ray detector; C is the distance between the X-ray focal length and the X-ray detector; D is the X-ray detector and the and a tenth step of calculating the distance D) between defects.