Self-test circuit for an integrated circuit and method for operating a self-test circuit for an integrated circuit

摘要

A self-test circuit for an integrated circuit comprising a plurality of scan chains is provided, each of the scan chains having a plurality of first storage elements, a data input for providing test data to the scan chain, the data input being connected to one of the first storage elements, a plurality of second storage elements and a switching device with a first and a second switching position, which is coupled between the first storage elements and the second storage elements and is set up to connect a last of the first storage elements to a data output in the first switching position, and in the second switching position respectively to connect the last of the first storage elements to a first of the second storage elements.