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3D shape measuring apparatus, three-dimensional shape measuring method, and three-dimensional shape measuring program

机译:3D形状测量装置,三维形状测量方法和三维形状测量程序

摘要

PROBLEM TO BE SOLVED: To provide a three-dimensional-shape measurement device, three-dimensional-shape measurement method, and three-dimensional-shape measurement program capable of accurately measuring a complicated three-dimensional shape.;SOLUTION: A three-dimensional-shape measurement device 18 acquires a plurality of photographic images by taking the surface of an object M from a plurality of angles, and calculates a plurality of tomographic images of the object M by a reverse projection method on the basis of the plurality of acquired photographic images.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2019,JPO&INPIT
机译:要解决的问题:提供三维形状测量装置,三维形状测量方法和三维形状测量程序,能够精确测量复杂的三维形状。;解决方案:三维 -Ape测量设备18通过从多个角度占据对象M的表面来获取多个摄影图像,并在多个获取的摄影中通过反向投影方法计算对象M的多个断层图像 图像。;所选绘图:图1;版权:(c)2019,JPO和INPIT

著录项

  • 公开/公告号JP6984870B2

    专利类型

  • 公开/公告日2021-12-22

    原文格式PDF

  • 申请/专利权人 学校法人 工学院大学;

    申请/专利号JP20170156886

  • 发明设计人 馬場 則男;

    申请日2017-08-15

  • 分类号G01B15/04;G01B11/24;G06T7;G06T19;

  • 国家 JP

  • 入库时间 2022-08-24 22:57:05

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