首页> 外国专利> PATTERN FILTER, THREE-DIMENSIONAL SHAPE MEASURING INSTRUMENT, THREE-DIMENSIONAL SHAPE MEASURING SYSTEM, THREE-DIMENSIONAL SHAPE MEASURING PROGRAM, PATTERN CODE GENERATION METHOD, AND THREE-DIMENSIONAL SHAPE METHOD

PATTERN FILTER, THREE-DIMENSIONAL SHAPE MEASURING INSTRUMENT, THREE-DIMENSIONAL SHAPE MEASURING SYSTEM, THREE-DIMENSIONAL SHAPE MEASURING PROGRAM, PATTERN CODE GENERATION METHOD, AND THREE-DIMENSIONAL SHAPE METHOD

机译:模式过滤器,三维形状测量仪器,三维形状测量系统,三维形状测量程序,图形代码生成方法和三维形状方法

摘要

PROBLEM TO BE SOLVED: To provide a three-dimensional shape measuring method reduced in an error by restoring a three-dimensional shape using a large color distance pattern light.;SOLUTION: In this pattern filter 1 for a pattern light for imaging a solid object projected with the pattern light passed through a filter divided into band-like areas to measure a three-dimensional shape based on a picked-up image, the projected pattern projected by the pattern filter has a plurality of slit lights. The slit lights form a slit light array patterns comprising the slit lights having equivalent color distances, and the slit light array patterns are arranged with the same distance to the pattern lights.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种三维形状测量方法,该方法通过使用大色距图案光恢复三维形状而减少了误差。解决方案:在该图案滤镜1中,用于对固体物体成像的图案光利用通过滤光器的图案光进行投影,该滤光器被划分成带状区域以基于拾取的图像测量三维形状,由图案滤光器投影的投影图案具有多个狭缝光。狭缝灯形成包括具有相等色距的狭缝灯的狭缝灯阵列图案,并且狭缝灯阵列图案与图案光以相同的距离布置。;版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005069987A

    专利类型

  • 公开/公告日2005-03-17

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20030303426

  • 申请日2003-08-27

  • 分类号G01B11/25;

  • 国家 JP

  • 入库时间 2022-08-21 22:34:27

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