首页> 外国专利> Method for analyzing composition of electronic component of electrical and electronic equipment, method of treating electronic waste, electric component component waste, composition analysis device of electronic / electrical device component waste, and processing device of electronic / electrical device part waste

Method for analyzing composition of electronic component of electrical and electronic equipment, method of treating electronic waste, electric component component waste, composition analysis device of electronic / electrical device component waste, and processing device of electronic / electrical device part waste

机译:分析电气和电子设备电子元件组成的方法,处理电子废物,电气部件废物,电子/电气装置组件废物的电气部件废物,组成分析装置的方法,以及电子/电气设备部件浪费的处理装置

摘要

Problem to be solved: to analyze the composition analysis of electronic waste components of electronic and electrical equipment, and to dispose of parts of electronic and electrical equipment parts, in order to improve the accuracy of image recognition, and to analyze the composition of parts wastes in the electronic parts of electronic and electrical equipment parts in a short time, regardless of individual experience or skill A device for analyzing a composition of electronic and electrical equipment parts waste and a processing apparatus for electronic and electrical device parts waste are provided.A plurality of parts of a plurality of electronic and electrical equipment components including a plurality of parts of the image are collected from the picked up imageImage recognition using machine learning systemExtract parts of electronic and electrical equipmentIncluding compositional analysisLearning data for machine learning systemIf the material of the raw material to be analyzed is reflected, theSet the confidence of the machine learning system to the first thresholdIf the raw material information is not reflected in the learning dataThis is a compositional analysis method of electronic and electrical device parts debris including extraction of electronic and electrical device parts debris by setting a second threshold value lower than the first threshold value.Diagram
机译:要解决的问题:分析电子和电气设备电子废物组件的组成分析,并处理电子和电气设备部件的部件,以提高图像识别的准确性,并分析零件废物的组成在短时间内电子和电气设备零件的电子部件中,无论个人经验或技能如何,用于分析电子和电气设备零件废物的组成和用于电子和电气设备部件废物的处理设备。多个包括多个电子和电气设备组件的多个电子和电气设备组件,包括使用电子和电气设备的机器学习分析数据的机器学习系统提取部分从拾取的图像识别部分收集图像的多个部分图像,用于机器学习系统,用于原料的材料分析被反映,将机器学习系统的置信度置信到第一个阈值,原料信息未反映在学习数据库中是电子和电气设备部件的组成分析方法,包括通过设置A提取电子和电气设备件碎片。第二阈值低于第一个阈值.diagram

著录项

  • 公开/公告号JP2021159881A

    专利类型

  • 公开/公告日2021-10-11

    原文格式PDF

  • 申请/专利权人 JX金属株式会社;

    申请/专利号JP20200066206

  • 发明设计人 後田 智也;河村 寿文;

    申请日2020-04-01

  • 分类号B09B5;B07C5/10;G06T7/62;G06T7;G01N21/27;

  • 国家 JP

  • 入库时间 2024-06-14 22:12:24

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