首页> 外国专利> SAMPLE HOLDER UNIT FOR SINGLE-CRYSTAL X-RAY STRUCTURAL ANALYSIS DEVICES

SAMPLE HOLDER UNIT FOR SINGLE-CRYSTAL X-RAY STRUCTURAL ANALYSIS DEVICES

机译:用于单晶X射线结构分析装置的样品架单元

摘要

A sample holder unit capable of quickly and easily soaking a sample in a crystalline sponge, and of quickly and accurately performing single-crystal X-ray structure analysis, is provided. The sample holder comprises a base part attached to a goniometer in a single-crystal X-ray structure analysis apparatus, the base part formed to have a sample introduction structure into which a sample to be soaked in a porous complex crystal is introduced; and a holding part that holds the porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein, the holding part formed to the base part, and there is provided an applicator 300 comprising an opening 302 and a storing space in which the sample holder is stored; a seal part 304 provided on a contact surface with the sample holder stored in the storing space; and a pull-out prevention part 305 that prevents the sample holder from being pulled out from the opening 302, the pull-out prevention part engaged with the sample holder stored in the storing space.
机译:提供了一种能够快速且容易地浸泡在结晶海绵中的样品,以及快速准确地执行单晶X射线结构分析的样品保持器单元。样品保持器包括在单晶X射线结构分析装置中附接到测量计的基部,基部形成为具有样品引入结构,其中引入待浸泡在多孔复合晶体中的样品;保持能够在其中形成的多个细孔中浸泡样品的多孔复合晶体的保持部分,形成在基部部分,并且设置有涂抹器300,包括开口302和存储空间存储样品支架;设置在接触表面上的密封部分304,其中样品保持器存储在存储空间中;和防止样品保持器从开口302拉出的拉出的防止部分305,从而与存储在存储空间中的样品保持器接合的拉出防止部分。

著录项

  • 公开/公告号EP3885750A1

    专利类型

  • 公开/公告日2021-09-29

    原文格式PDF

  • 申请/专利权人 RIGAKU CORPORATION;

    申请/专利号EP20190886784

  • 发明设计人 SATO TAKASHI;

    申请日2019-11-21

  • 分类号G01N23/20025;G01N23/205;G01N23/207;G01N1/28;

  • 国家 EP

  • 入库时间 2022-08-24 21:20:24

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