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SAMPLE HOLDER UNIT FOR SINGLE-CRYSTAL X-RAY STRUCTURAL ANALYSIS DEVICES

机译:用于单晶X射线结构分析装置的样品架单元

摘要

A sample holder unit for a single-crystal X-ray structure analysis apparatus that quickly, surely and easily performs structure analysis with a crystalline sponge, the structure analysis inclusive of an operation of attaching a sample soaked in the crystalline sponge thereto, even if having no specialized knowledge, is provided. There are provided a sample holder, and an applicator comprising an opening 302 and a storing space in which the sample holder is stored, and a pull-out prevention part that selectively prevents and releases the sample holder stored in the storing space from being pulled out from the opening 302, wherein the pull-out prevention part comprises an operation part that releases pull-out prevention thereof in a state where the sample holder stored in the applicator is attached to the goniometer.
机译:用于单晶X射线结构分析装置的样品架单元,可通过晶体海绵快速,易于且容易地进行结构分析,该结构分析包括将浸泡在结晶海绵中的样品附着在其上的操作,即使具有 没有提供专门知识。 提供了一种样品支架,并且包括开口302的涂抹器和存储空间支架的存储空间,以及选择性地防止和释放存储在存储空间中的样品支架的拉出防止部分被拉出 从开口302中,其中拉出的防止部件包括在存储在涂抹器中的样品保持器附接到测梁计的状态下释放其预防的操作部分。

著录项

  • 公开/公告号EP3885753A1

    专利类型

  • 公开/公告日2021-09-29

    原文格式PDF

  • 申请/专利权人 RIGAKU CORPORATION;

    申请/专利号EP20190887709

  • 发明设计人 SATO TAKASHI;

    申请日2019-11-21

  • 分类号G01N23/20025;G01N23/205;G01N23/207;G01N1/28;

  • 国家 EP

  • 入库时间 2022-08-24 21:20:24

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