首页> 外国专利> EVALUATION METHOD OF VAPOR DEPOSITION CHAMBER OF ORGANIC DEVICE MANUFACTURING APPARATUS STANDARD MASK APPARATUS AND STANDARD SUBSTRATE USED THEREIN STANDARD MASK APPARATUS MANUFACTURING METHOD ORGANIC DEVICE MANUFACTURING APPARATUS HAVING VAPOR DEPOSITION CHAMBER EVALUATED BY EVALUATION METHOD ORGANIC DEVICE HAVING VAPOR DEPOSITION LAYER FORMED IN VAPOR DEPOSITION CHAMBER EVALUATED BY EVALUATION METHOD AND VAPOR DEPOSITION CHAMBER MAINTENANCE METHOD OF ORGANIC DEVICE MANUFACTURING APPARATUS

EVALUATION METHOD OF VAPOR DEPOSITION CHAMBER OF ORGANIC DEVICE MANUFACTURING APPARATUS STANDARD MASK APPARATUS AND STANDARD SUBSTRATE USED THEREIN STANDARD MASK APPARATUS MANUFACTURING METHOD ORGANIC DEVICE MANUFACTURING APPARATUS HAVING VAPOR DEPOSITION CHAMBER EVALUATED BY EVALUATION METHOD ORGANIC DEVICE HAVING VAPOR DEPOSITION LAYER FORMED IN VAPOR DEPOSITION CHAMBER EVALUATED BY EVALUATION METHOD AND VAPOR DEPOSITION CHAMBER MAINTENANCE METHOD OF ORGANIC DEVICE MANUFACTURING APPARATUS

机译:有机器件制造装置的气相沉积室的评估方法标准掩模装置和标准衬底的标准掩模装置制造方法有机器件制造装置具有通过评估方法评价的气相沉积室,通过评估方法,该有机装置具有通过评估评估的气相沉积室中形成的气相沉积层。 有机器件制造装置的方法和气相沉积室维持方法

摘要

A method for evaluating a deposition chamber of an apparatus for manufacturing an organic device is a deposition process in which a material is deposited on a standard substrate including a standard mark through a through hole of a standard mask of a standard mask apparatus to form a deposition layer on a standard substrate in the deposition chamber and a unloading step of unloading the standard substrate on which the deposition layer is formed from the manufacturing apparatus, and an observation step of observing the positional relationship between the standard mark and the deposition layer on the standard substrate unloaded from the production device.
机译:一种用于评估用于制造有机装置的装置的沉积室的方法是沉积过程,其中材料沉积在包括标准标记的标准衬底上,通过标准掩模装置的标准掩模的通孔形成沉积 在沉积室中的标准衬底上的层和卸载由制造装置形成沉积层的标准基板的卸载步骤,以及在标准上观察标准标记和沉积层之间的位置关系的观察步骤 从生产装置卸载的基板。

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