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AUTOMATIC TEST PATTERN GENERATION (ATPG) FOR PARAMETRIC FAULTS
AUTOMATIC TEST PATTERN GENERATION (ATPG) FOR PARAMETRIC FAULTS
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机译:用于参数故障的自动测试模式生成(ATPG)
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摘要
Systems and methods for automatic test pattern generation (ATPG) for parametric faults are described. A model may be constructed to predict a measurement margin for an integrated circuit (IC) design based on a random sample of random variables. A set of failure events may be determined for the IC design using the model, where each failure event may correspond to a set of values of the random variables that is expected to cause a metric for the IC design to violate a threshold.
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