首页> 外国专利> A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM

A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM

机译:一种光谱仪系统和用于补偿光谱仪系统产生的干涉图的时间周期性扰动的方法

摘要

A spectrometer system comprises a scanning interferometer; a drive system mechanically coupled to a movable reflector element of the scanning interferometer and operable to effect reciprocation of the movable reflector element at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer to generate a sampled interferogram; and a data processor is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.
机译:光谱仪系统包括扫描干涉仪; 驱动系统机械地连接到扫描干涉仪的可移动反射器元件,并且可操作以在多个,优选两个,例如三个不同的扫描速度下实现可移动反射器元件的往复运动; 一种检测器装置,被配置为以等距时间间隔采样,由扫描干涉仪形成的干涉图以产生采样的干扰图; 数据处理器适于在多个不同扫描速度中的每一个中获取采样的干扰图,并执行所获取的多个采样干扰图的内容的相对比较。

著录项

  • 公开/公告号EP3254073B1

    专利类型

  • 公开/公告日2021-08-25

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP20150703111

  • 发明设计人 ANDERSEN STEEN KJAER;ANDERSEN MADS LYKKE;

    申请日2015-02-02

  • 分类号G01J3/45;G01J3/453;

  • 国家 EP

  • 入库时间 2022-08-24 20:47:14

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