首页> 外国专利> A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM

A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM

机译:光谱仪系统和补偿光谱仪系统产生的干涉图的时间周期扰动的方法

摘要

A spectrometer system comprises a scanning interferometer; a drive system mechanically coupled to a movable reflector element of the scanning interferometer and operable to effect reciprocation of the movable reflector element at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer to generate a sampled interferogram; and a data processor is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.
机译:光谱仪系统包括扫描干涉仪;驱动系统,其机械地耦合到扫描干涉仪的可移动反射器元件,并且可操作地以多个,优选地大于两个,例如三个不同的扫描速度实现可移动反射器元件的往复运动;检测器装置,被配置为以等距时间间隔对由扫描干涉仪形成的干涉图进行采样以生成采样干涉图;数据处理器适于以多个不同的扫描速度中的每一个获取采样的干涉图,并且对所获取的多个采样的干涉图的内容进行相对比较。

著录项

  • 公开/公告号EP3254073A1

    专利类型

  • 公开/公告日2017-12-13

    原文格式PDF

  • 申请/专利权人 FOSS ANALYTICAL A/S;

    申请/专利号EP20150703111

  • 发明设计人 ANDERSEN STEEN KJAER;ANDERSEN MADS LYKKE;

    申请日2015-02-02

  • 分类号G01J3/45;G01J3/453;

  • 国家 EP

  • 入库时间 2022-08-21 13:16:53

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